1.1: Specimen preparation in materials science / P. J. Goodhew |
Autore | Goodhew, Peter J. |
Pubbl/distr/stampa | Amsterdam ; London, : North-Holland |
Descrizione fisica | 180 p. : ill. ; 23 cm. |
Disciplina | 502.825 |
Soggetto non controllato | preparazione dei campioni nella scienza dei materiali |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910588000403321 |
Goodhew, Peter J. | ||
Amsterdam ; London, : North-Holland | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland |
Autore | Goodhew, Peter J. |
Edizione | [3rd ed.] |
Pubbl/distr/stampa | London ; New York : Taylor & Francis, 2001 |
Descrizione fisica | x, 251 p. : ill. ; 24 cm |
Disciplina | 502.825 |
Altri autori (Persone) |
Humphreys, F. J.
Beanland, R. |
Soggetto topico | Electron microscopy |
ISBN | 0748409688 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISALENTO-991001754869707536 |
Goodhew, Peter J. | ||
London ; New York : Taylor & Francis, 2001 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. del Salento | ||
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Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland |
Autore | Goodhew Peter J. |
Edizione | [3rd ed.] |
Pubbl/distr/stampa | Boca Raton, FL : , : CRC Press, , 2014 |
Descrizione fisica | 1 online resource (262 p.) |
Disciplina |
502.825
502/.8/25 |
Soggetto topico | Electron microscopy |
Soggetto genere / forma | Electronic books. |
ISBN |
0-429-17625-2
1-4822-8934-2 1-4200-1725-X 1-282-77797-1 9786612777974 0-203-18425-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
Record Nr. | UNINA-9910449760303321 |
Goodhew Peter J. | ||
Boca Raton, FL : , : CRC Press, , 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland |
Autore | Goodhew Peter J. |
Edizione | [3rd edition.] |
Pubbl/distr/stampa | Boca Raton, FL : , : CRC Press, , 2014 |
Descrizione fisica | 1 online resource (262 p.) |
Disciplina |
502.825
502/.8/25 |
Soggetto topico | Electron microscopy |
ISBN |
0-429-17625-2
1-4822-8934-2 1-4200-1725-X 1-282-77797-1 9786612777974 0-203-18425-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
Record Nr. | UNINA-9910777360903321 |
Goodhew Peter J. | ||
Boca Raton, FL : , : CRC Press, , 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland |
Autore | Goodhew Peter J. |
Edizione | [3rd edition.] |
Pubbl/distr/stampa | Boca Raton, FL : , : CRC Press, , 2014 |
Descrizione fisica | 1 online resource (262 p.) |
Disciplina |
502.825
502/.8/25 |
Soggetto topico | Electron microscopy |
ISBN |
0-429-17625-2
1-4822-8934-2 1-4200-1725-X 1-282-77797-1 9786612777974 0-203-18425-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
Record Nr. | UNINA-9910816501503321 |
Goodhew Peter J. | ||
Boca Raton, FL : , : CRC Press, , 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Teaching Engineering |
Altri autori (Persone) | Goodhew, Peter J |
ISBN | 1-907207-22-8 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Teaching Engineering All you need to know about engineering education but were afraid to ask |
Record Nr. | UNISA-996320206503316 |
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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